Report/Guide

Burke, T*; Leach, R K; Boyd, R; Gee, M G; Roy, D; Yacoot, A; Ulrich-Danzebrink, H*; Dziomba, T*; Koenders, L*; Depero, L E*; Carneiro, K*; Dirschel, K*; Morazzani, V*; Lausmaa, J*; Pendrill, L*; Pidduck, A*; Roebben, G*; Sánchez, A*; Unger, W E S*; Proykova, A* (2011) European Nanometrology 2020. Technical Report. Co-Nanomet.

Hansen, P-E*; Roebben, G*; Babick, F*; Boyd, R; Braun, A*; Busch, I*; Danzebrink, H-U*; Depero, L*; Dirscherl, K*; Dziomba, T*; Eriksson, E*; Franks, K*; Gee, M G; Jennett, N M; Kestens, V*; Koenders, L*; Krumrey, M*; Lausmaa, J*; Leach, R K; Pendrill, L*; Pidduck, A*; Put, S*; Roy, D; Stintz, M*; Turan, R*; Yacoot, A (2010) Introductory guide to nanometrology. Technical Report. European Commission.

Article

Leach, R K; Boyd, R; Burke, T*; Danzebrink, H-U*; Dirscherl, K*; Dziomba, T*; Gee, M G; Koenders, L*; Morazzani, V*; Pidduck, A*; Roy, D; Unger, W E S*; Yacoot, A (2011) The European nanometrology landscape. Nanotechnology, 22. 062001

Klapetek, P*; Nacas, D*; Campbellova, A*; Yacoot, A; Koenders, L* (2011) Methods for determining and processing 3D errors and uncertainties for AFM data analysis. Meas. Sci. Technol., 22 (2). 025501

Yacoot, A; Koenders, L* (2011) Recent developments in dimensional metrology using AFMs. Meas. Sci. Technol., 22 (12). 122001

Yacoot, A; Koenders, L* (2008) Aspects of scanning force microscope (SFM) cantilevers and tips and their effects on dimensional measurement. J. Phys. D, Appl. Phys., 41 (10). 103001

Yacoot, A; Koenders, L* (2003) From nanometre to millimetre: a feasibility study of the combination of scanning probe microscopy and combined optical and X-ray interferometry. Meas. Sci. Technol., 14 (9). N59-N63

Yacoot, A; Kuetgens, U*; Koenders, L*; Weimann, T* (2001) A combined scanning tunnelling microscope and x-ray interferometer. Meas. Sci. Technol., 12. pp. 1660-1665.