Article

Bu, T; Gao, H; Yao, Y; Wang, J; Pollard, A J; Legge, E J; Clifford, C A; Delvallee, A; Ducourtieux, S; Lawn, M A; Babic, B; Coleman, V A; Jamting, A; Zou, S; Chen, M; Jakubek, Z J; Iacob, E; Chanthawong, N; Mongkolsuttirat, K; Zeng, G; Almeida, C M; He, B-C; Hyde, L; Ren, L (2023) Thickness measurements of graphene oxide flakes using atomic force microscopy: Results of an international interlaboratory comparison. Nanotechnology, 34 (22). 225702