Article

Schmitt, R H*; Peterek, M*; Morse, E*; Knapp, W*; Hartig, F*; Goch, G*; Hughes, B; Forbes, A B; Estler, W T* (2016) Advances in large-scale metrology - review and future trends. CIRP Ann. - Manuf. Technol., 65 (2). pp. 643-665.

Forbes, A B; Smith, I M; Hartig, F*; Wendt, K* (2015) Overview of EMRP Joint Research Project NEW06 "Traceability for Computationally Intensive Metrology". Advances in Mathematics for Applied Sciences, 86. pp. 164-170.