Article

Kumar, N; Zoladek-Lemanczyk, A; Guilbert, A A Y*; Su, W T*; Tuladhar, S M*; Kirchartz, T*; Schroeder, B C*; McCulloch, I*; Nelson, J*; Roy, D; Castro, F A (2017) Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale. Nanoscale, 9 (8). pp. 2723-2731.