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Harris, P M; Leach, R K; Giusca, C (2010) Uncertainty evaluation for the calculation of a surface texture parameter in the profile case. NPL Report. MS 8
Leach, R K; Giusca, C (2009) Results from a comparison of optical thin film thickness measurement. NPL Report. ENG 18
Giusca, C; Severn, I; Greenwood, J C (2007) The effect of hydraulic fluids on pressure balances. NPL Report. DEPC-EM 009
Yang, X; Sun, W; Giusca, C (2022) An automated surface determination approach for computed tomography. NDT & E International, 131. 102697
Sun, W J; Giusca, C; Lou, S; Yang, X Y; Chen, X; Fry, T; Jiang, X Q; Wilson, A; Brown, S; Boulter, H (2022) Establishment of X-ray computed tomography traceability for additively manufactured surface texture evaluation. Additive Manufacturing, 50. 102558
Sanz, C; Giusca, C; Morantz, P; Marin, A; Chérif, A; Schneider, J; Mainaud-Durand, H; Shore, P; Steffens, N (2018) Form measurement of a 0.1 mm diameter wire with a chromatic confocal sensor, with associated uncertainty evaluation. Measurement Science and Technology, 29 (7). 074010 ISSN 0957-0233
Smith, I M; Harris, P M; Todhunter, L D; Giusca, C; Jiang, X; Scott, P; Leach, R K (2017) Algorithms and software for areal surface texture function parameters. Measurement Science and Technology, 28 (10). 105008
Wood, S; O'Connor, D; Jones, C W; Claverley, J D; Blakesley, J C; Giusca, C; Castro, F A (2017) Transient photocurrent and photovoltage mapping for characterization of defects in organic photovoltaics. Sol. Energy Mater. Sol. Cells, 161. pp. 89-95.
Leach, R K; Giusca, C; Guttmann, M*; Jakobs, P J*; Rubert, P* (2015) Development of low-cost material measures for calibration of the metrological characteristics of areal surface texture instruments. CIRP Ann. - Manuf. Technol., 64 (1). pp. 545-548.
Leach, R K; Giusca, C; Rickens, K*; Riemer, O*; Rubert, P* (2014) Development of material measures for performance verifying surface topography measuring instruments. Surf. Topogr.: Metrol. Prop., 2 (2). 025002
Henning, A J; Giusca, C; Forbes, A B; Smith, I; Leach, R K; Coupland, J*; Mandal, R* (2013) Correction for lateral distortion in coherence scanning interferometry. CIRP Ann. - Manuf. Technol., 62. pp. 547-550.
Leach, R K; Claverley, J D; Giusca, C; Jones, C W; Nimishakavi, L P; Sun, W; Tedaldi, M; Yacoot, A (2012) Advances in engineering nanometrology at the National Physical Laboratory. Meas. Sci. Technol., 23 (7). 074002
Harris, P M; Smith, I M; Leach, R K; Giusca, C; Jiang, X*; Scott, P* (2012) Software measurement standards for areal surface texture parameters: Part I - algorithms. Meas. Sci. Technol., 23 (10). 105008
Harris, P M; Smith, I M; Wang, C*; Giusca, C; Leach, R K (2012) Software measurement standards for areal surface texture parameters: Part II - comparison of software. Meas. Sci. Technol., 23 (10). 105009
Leach, R K; Giusca, C; Naoi, K* (2010) Traceability for areal surface texture measurement. Key Eng. Mater., 437. pp. 121-125.
Yacoot, A; Leach, R K; Hughes, B; Giusca, C; Jones, C W; Wilson, A (2009) Dimensional nanometrology at The National Physical Laboratory. Proc. SPIE - Int. Soc. Opt. Eng., 7133. pp. 713345-1.
Sun, W; Chen, X; Giusca, C; Lou, S; Jones, C W; Boulter, H; Brown, S (2022) Evaluation of X-ray computed tomography for surface texture measurements using a prototype additively manufactured reference standard. In: 11th Conference on Industrial Computed Tomography (iCT 2022), 08-11 February 2022, Wels, Austria.
Leach, R K; Coupland, J*; Mandal, R*; Giusca, C; Foreman, M* (2012) Calibration of areal surface topography measuring instruments: are we there yet? In: 27th Annual Meeting of the American Society for Precision Engineering., 21-26 October 2012, San Diego, CA, USA.
Harris, P M; Leach, R K; Giusca, C (2011) Uncertainty evaluation for the calculation of a surface texture parameter in the profile case. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.
Leach, R K; Li, T*; Jiang, X*; Blunt, L*; Giusca, C (2010) Comparison of commercial software packages for calculating surface texture parameters. In: 10th International Conference of the European Society for Precision Engineering & Nanotechnology (euspen), 31 May - 4 June 2010, Delft, Netherlands.
Leach, R K; Giusca, C; Naoi, K* (2009) Traceability for areal surface texture measurement. In: 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), 29 June - 2 July 2009, Saint-Petersburg, Russia.
Leach, R K; Giusca, C (2008) Traceable measurement of areal surface texture. In: Proceedings of the 4th International Conference on Multi-Material Micro Manufacture (4M 2008), 9-11 September 2008, Cardiff, UK.