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Surana, S*; Conard, T*; Fleischmann, C*; Tait, J G*; Bastos, J P*; Voroshazi, E*; Havelund, R; Turbiez, M*; Louette, P*; Felten, A*; Poleunis, C*; Delcorte, A*; Vandervorst, W* (2016) Understanding physico-chemical aspects in the depth profiling of polymer: fullerene layers. J. Phys. Chem. C, 120 (49). pp. 28074-28082.

Fleischmann, C*; Conard, T*; Havelund, R; Franquet, A*; Poleunis, C*; Voroshazi, E*; Delcorte, A*; Vandervorst, W* (2014) Fundamental aspects of Ar-n(+) SIMS profiling of common organic semiconductors. Surf. Interface Anal., 46. pp. 54-57.

Franquet, A*; Fleischmann, C*; Conrad, T*; Voroshazi, E*; Poleunis, C*; Havelund, R; Delcorte, A*; Vandervorst, W* (2014) G-SIMS analysis of organic solar cell materials. Surf. Interface Anal., 46. pp. 96-99.