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Items where Author is "Dura, J A*"

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Seah, M P; Unger, W E S*; Hai Wang*,, ; Jordaan, W*; Gross, Th*; Dura, J A*; Dae Won Moon*,, ; Totarong, P*; Krumrey, M*; Hauert, R*; Mo Zhiqiang*, (2009) Ultra thin SiO2 on Si IX: Absolute Measurements of the Amount of silicon oxide as a thickness of SiO2 on Si. Surf. Interface Anal., 41 (5). pp. 430-439.

Dura, J A*; Seah, M P (2004) Advances in measurement: neutron reflectometry for highly accurate nanometer metrology.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinlander, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyun Mo Cho*,, ; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Baily, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36 (9). pp. 1269-1303.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinländer, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyan Mo Cho*,, ; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Bailey, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36. pp. 1269-1303.

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