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Items where Author is "Dambrine, G*"

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Votsi, H*; Roch-Jeune, I*; Haddadi, K*; Li, C*; Dambrine, G*; Aaen, P H*; Ridler, N M (2016) Development of a reference wafer for on-wafer testing of extreme impedance devices. In: 88th ARFTG Microwave Measurement Conference (ARFTG), 8-9 December 2016, Austin, Tx, USA.

This list was generated on Mon Oct 18 02:41:44 2021 BST.