Article

Lorenz, M; Shard, A G; Counsell, J D P*; Hutton, S*; Gilmore, I S (2016) Angular distribution of molecules sputtered by gas cluster ion beams and implications for secondary neutral mass spectrometry. J. Phys. Chem. C, 120 (44). p. 25317.

Belsey, N A; Cant, D J H; Minelli, C; Araujo, J R*; Bock, B*; Bruner, P*; Castner, D G*; Ceccone, G*; Counsell, J D P*; Dietrich, P M*; Engelhard, M H*; Spampinato, V*; Fearn, S*; Galhardo, C E*; Kalbe, H*; Kim, J W*; Lartundo-Rojas, L*; Luftman, H S*; Nunney, T S*; Pseiner, J*; Smith, E F*; Spampinato, V*; Sturm, J M*; Thomas, A G*; Treaty, J P W*; Veith, L*; Wagstaffe, M*; Wang, H*; Wang, M L*; Wang, Y C*; Werner, W*; Yang, L*; Shard, A G (2016) Versailles Project on Advanced Materials and Standards interlaboratory study on measuring the thickness and chemistry of nanoparticle coatings using XPS and LEIS. J. Phys. Chem. C, 120 (42). pp. 24070-24079.

Shard, A G; Havelund, R; Spencer, S J; Gilmore, I S; Alexander, M R*; Angerer, T B*; Aoyagi, S*; Barnes, J P*; Benayad, A*; Bernasik, A*; Ceccone, G*; Counsell, J D P*; Deeks, C*; Fletcher, J S*; Graham, D J*; Heuser, C*; Lee, T G*; Marie, C*; Marzec, M M*; Mishra, G*; Rading, D*; Renault, O*; Scurr, D J*; Shon, H K*; Spampinato, V*; Tian, H*; Wang, F Y*; Winograd, N*; Wu, K*; Wucher, A*; Zhou, Y F*; Zhu, Z H* (2015) Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study. J. Phys. Chem. B, 119 (33). pp. 10784-10797.