Article

Dhillon, S S*; Vitiello, M S*; Linfield, E H*; Davies, A G*; Hoffmann, M C*; Booske, J*; Paoloni, C*; Gensch, M*; Weightman, P*; Williams, G P*; Castro-Camus, E*; Cumming, D R S*; Simoens, F*; Escorcia-Carranza, I*; Grant, J*; Lucyszyn, S*; Kuwata-Gonokami, M*; Konishi, K*; Koch, M*; Schmuttermaer, C A*; Cocker, T L*; Huber, R*; Markelz, A G*; Taylor, Z D*; Wallace, V P*; Zeitler, J A*; Sibik, J*; Korter, T M*; Ellison, B*; Rea, S*; Goldsmith, P*; Cooper, K B*; Appleby, R*; Pardo, D*; Huggard, P G*; Krozer, V*; Shams, H*; Fice, M*; Renaud, C*; Seeds, A*; Stohr, A*; Naftaly, M; Ridler, N M; Clarke, R*; Cunningham, J E*; Johnston, M B* (2017) The 2017 terahertz science and technology roadmap. J. Phys. D, Appl. Phys., 50 (4). 043001

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2013) The trace is on measurements: developing traceability for S-parameter measurements at millimeter and submillimeter wavelengths. IEEE Microw. Mag., 14 (7). pp. 67-74.

Conference or Workshop Item

Khalid, A*; Cummings, D*; Clarke, R*; Li, C*; Ridler, N M (2016) Evaluation of a VNA-based materials characterization kit at frequencies from 0.75 THz to 1.1 THz. In: 2016 IEEE 9th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT), 5-7 September 2016, Qingdao, China.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2011) Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz. In: 78th ARFTG Microwave Measurement Symposium, 1 - 2 December 2011, Tempe, AZ, USA.

Ridler, N M; Salter, M J; Wilson, A; Pollard, R*; Clarke, R* (2009) Traceability to National Standards for S parameter measurements of waveguide devices from 110 GHz to 170 GHz. In: 73rd ARFTG Microwave Measurement Conference, 12 June 2009, Boston, USA.