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Rerucha, S*; Yacoot, A; Pham, T M*; Cizek, M*; Hucl, V*; Lazar, J*; Cip, O* (2017) Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode. Meas. Sci. Technol., 28 (4). 045204