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Items where Author is "Calleau, A R"

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Shu, M; Shang, X; Ridler, N M; Calleau, A R; Dimitriadis, A I; Zhang, A (2024) Improvements to Millimeter-wave Dielectric Measurement Using Material Characterization Kit (MCK). IEEE Transactions on Instrumentation and Measurement, 73. 6001108

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