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Items where Author is "Brennen, B"
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Byrne, C*; Brennen, B; McCoy, A P*; Bogan, J*; Brady, A*; Hughes, G* (2016) In-situ XPS chemical analysis of MnSiO3 copper diffusion barrier layer formation and simultaneous fabrication of metal oxide semiconductor electrical test MOS structures. ACS Appl. Mater. Interfaces, 8 (4). pp. 2470-2477.