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Items where Author is "Boarino, L*"
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Yang, L; Seah, M P; Gilmore, I S; Morris, R J H*; Dowsett, M G*; Boarino, L*; Sparnacci, K*; Laus, M* (2013) Depth profiling and melting of nanoparticles in Secondary Ion Mass Spectrometry (SIMS). J. Phys. Chem. C, 117 (31). pp. 16042-16052.