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Czarnecki, A J; Kolev, N L; See, P; Sullivan, N J; Behn, W A; Curson, N J; Stock, T J Z; Grütter, P (2025) Hydrogen passivation effects on spatially resolved charge trap densities in Si(100)–SiO2. AIP Advances, 15 (10). 105024 ISSN 2158-3226