Report/Guide

Hansen, P-E*; Roebben, G*; Babick, F*; Boyd, R; Braun, A*; Busch, I*; Danzebrink, H-U*; Depero, L*; Dirscherl, K*; Dziomba, T*; Eriksson, E*; Franks, K*; Gee, M G; Jennett, N M; Kestens, V*; Koenders, L*; Krumrey, M*; Lausmaa, J*; Leach, R K; Pendrill, L*; Pidduck, A*; Put, S*; Roy, D; Stintz, M*; Turan, R*; Yacoot, A (2010) Introductory guide to nanometrology. Technical Report. European Commission.

Article

Kestens, V*; Roebben, G*; Herrmann, J*; Jamting, A*; Coleman, V*; Minelli, C; Clifford, C; De Temmerman, P J*; Mast, J*; Liu, J J*; Babick, F*; Colfen, H*; Emons, H* (2016) Challenges in the size analysis of a silica nanoparticle mixture as candidate certified reference materials. J. Nanoparticle Res., 18 (6). p. 171.