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Items where Author is "Avis, W"

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Trager-Cowan, C; Alasmari, A; Avis, W; Bruckbauer, J; Edwards, P R; Hourahine, B; Kraeusel, S; Kusch, G; Jablon, B M; Johnston, R; Martin, R W; Mcdermott, R; Naresh-Kumar, G; Nouf-Allehiani, M; Pascal, E; Thomson, D; Vespucci, S; Mingard, K; Parbrook, P J; Smith, M D; Enslin, J; Mehnke, F; Kneissl, M; Kuhn, C; Wernicke, T; Knauer, A; Hagedorn, S; Walde, S; Weyers, M; Coulon, P-M; Shields, P A; Zhang, Y; Jiu, L; Gong, Y; Smith, R M; Wang, T; Winkelmann, A (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. IOP Conference Series: Materials Science and Engineering, 891. 012023 ISSN 1757-899X

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