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Items where Author is "Araujo, J R*"

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Kim, K J*; Kim, A S*; Jang, J S*; Suh, J K*; Wirth, T*; Hodoroaba, V D*; Unger, W*; Araujo, J R*; Archanjo, B S*; Galhardo, C E*; Damasceno, J*; Achete, C A*; Wang, H*; Wang, M L*; Bennett, J*; Simons, D*; Kurokawa, A*; Terauchi, S*; Fujimoto, T*; Streeck, C*; Beckhoff, B*; Spencer, S; Shard, A (2016) Final report of the CCQM-K129 measurement of mole fractions of Cu, In, Ga and Se in Cu(In, Ga)Se-2 films. Metrologia, 53 (1A). 08011.

Belsey, N A; Cant, D J H; Minelli, C; Araujo, J R*; Bock, B*; Bruner, P*; Castner, D G*; Ceccone, G*; Counsell, J D P*; Dietrich, P M*; Engelhard, M H*; Spampinato, V*; Fearn, S*; Galhardo, C E*; Kalbe, H*; Kim, J W*; Lartundo-Rojas, L*; Luftman, H S*; Nunney, T S*; Pseiner, J*; Smith, E F*; Spampinato, V*; Sturm, J M*; Thomas, A G*; Treaty, J P W*; Veith, L*; Wagstaffe, M*; Wang, H*; Wang, M L*; Wang, Y C*; Werner, W*; Yang, L*; Shard, A G (2016) Versailles Project on Advanced Materials and Standards interlaboratory study on measuring the thickness and chemistry of nanoparticle coatings using XPS and LEIS. J. Phys. Chem. C, 120 (42). pp. 24070-24079.

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