Zou, L; Dusek, M; Hunt, C (1998) Evaluate the effect of ageing on the cleanabilty of solder flux residues. NPL Report. CMMT(A)107

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Abstract

The cleaning efficiency of flux residues of various ages were assessed by measuring the ionic contamination removed in an Ionograph 500 SMD. The flux residues were removed from bare boards, and boards with through hole and surface mount components. The effect of different temperature ageing was also investigated. The work has shown that there is a maximum time interval following assembly during which cleaning should be carried out. The ionic contamination of aged assemblies with through hole and surface mount components were cleaned with varying efficiencies. The surface mount components were more difficult to clean. The use of brushing and scrubbing proved particularly beneficial for the through hole components. A proprietary cleaner proved more effective than the alternatives considered.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMMT(A)107
Subjects:	Advanced Materials Advanced Materials > Electronics Interconnection
Last Modified:	10 Sep 2018 14:35
URI:	http://eprintspublications.npl.co.uk/id/eprint/997

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