Koutsourakis, G; Thompson, A; Blakesley, J C; Wood, S (2023) Compressed Sensing Spectral Photoluminescence Imaging of Wide Bandgap Semiconductor Materials for Power Electronics Applications. In: Sensor and Measurement Science International, 08-11 May 2023, Nurnberg.

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Abstract

A compressed sensing approach has been adopted for spectral photoluminescence imaging measurements at NPL. The features and performance of the proposed methodology is initially studied with simulations, which looked at the requirements for a measurement system implementation. Simulation results are presented for a typical homoepitaxial 4H-SiC defect, while an experimental implementation is proposed. Compressed sensing can offer a higher signal to noise ratio and faster measurement acquisition for spectral PL measurements than conventional techniques.

Item Type:	Conference or Workshop Item (Paper)
Keywords:	spectral photoluminescence, compressed sensing, semiconductor metrology, power electronics, silicon carbide
Subjects:	Advanced Materials > Functional Materials
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.5162/SMSI2023/D5.0
Last Modified:	31 Jan 2024 15:54
URI:	http://eprintspublications.npl.co.uk/id/eprint/9917

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