Zou, L; Hunt, C (1998) Surface insulation resistance (SIR) response to various processing parameters. NPL Report. CMMT(A)120

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Abstract

SIR testing is carried out under a wider range of experimental conditions than those detailed in standards. The work here explores some of the issues when using a range of fluxes with various processing conditions that include the influence of substrate finish, test bias and reflow processing. These results clearly show that care must be exercised when using different test set-ups, and extrapolating between testing and use conditions. In particular the use of 50V test bias can produce anomalous results when compared to a 5V use environment.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMMT(A)120
Subjects:	Advanced Materials Advanced Materials > Electronics Interconnection
Last Modified:	10 Sep 2018 14:36
URI:	http://eprintspublications.npl.co.uk/id/eprint/985

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