Gwyn, S; Watson, S; Slight, T; Knapp, M; Viola, S; Ivanov, P; Zhang, W; Yadav, A; Rafailov, E; Haji, M; Doherty, K E; Stanczyk, S; Grzanka, S; Perlin, P; Najda, S P; Leszczyski, M; Kelly, A E (2021) Dynamic Device Characteristics and Linewidth Measurement of InGaN/GaN Laser Diodes. IEEE Photonics Journal, 13 (1). ISSN 1943-0647

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Item Type:	Article
Subjects:	Time and Frequency > Microwave Frequency Standards
Divisions:	Time & Frequency
Identification number/DOI:	10.1109/JPHOT.2020.3045218
Last Modified:	28 Jul 2021 14:10
URI:	http://eprintspublications.npl.co.uk/id/eprint/9265

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