Naftaly, M; Das, S; Gallop, J; Pan, K; Alkhalil, F; Kariyapperuma, D; Constant, S; Ramsdale, C; Hao, L (2021) Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques. Electronics, 10 (8). 960 ISSN 2079-9292

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Item Type:	Article
Subjects:	Electromagnetics > Electrical Measurement
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.3390/electronics10080960
Last Modified:	23 Jul 2021 10:22
URI:	http://eprintspublications.npl.co.uk/id/eprint/9249

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