Clarke, R G; Shang, X; Ridler, N M; Lozar, R; Probst, T; Arz, U (2020) An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1109/ARFTG47584.2020.9071783
Last Modified:	12 Nov 2020 11:22
URI:	https://eprintspublications.npl.co.uk/id/eprint/8970