Wu, A; Liu, C; Liang, F; Zou, X; Wang, Y; Luan, P; Li, C; Ridler, N (2020) Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems. IEEE Transactions on Microwave Theory and Techniques, 68 (8). pp. 3558-3564. ISSN 0018-9480

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Item Type:	Article
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1109/TMTT.2020.2988461
Last Modified:	28 Oct 2020 14:04
URI:	http://eprintspublications.npl.co.uk/id/eprint/8942

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