< back to main site

Publications

Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems

Wu, A; Liu, C; Liang, F; Zou, X; Wang, Y; Luan, P; Li, C; Ridler, N (2020) Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems. IEEE Transactions on Microwave Theory and Techniques, 68 (8). pp. 3558-3564. ISSN 0018-9480

Full text not available from this repository.
Item Type: Article
Subjects: Electromagnetics > RF and Microwave
Divisions: Electromagnetic & Electrochemical Technologies
Identification number/DOI: 10.1109/TMTT.2020.2988461
Last Modified: 28 Oct 2020 14:04
URI: http://eprintspublications.npl.co.uk/id/eprint/8942

Actions (login required)

View Item View Item