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Verification of a 3D analytical model of multilayered piezoelectric systems using finite element analysis

McCartney, L N; Crocker, L E; Wright, L (2019) Verification of a 3D analytical model of multilayered piezoelectric systems using finite element analysis. Journal of Applied Physics, 125 (18). 184503 ISSN 0021-8979

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An approximate 3D analytical model of multi-layered systems is developed that can be used to identify promising dimensions and property selection during the initial design of components needed for micro- and nano-scaled devices. This paper is focused on the deformation of nano-scaled crystallographic systems of perfectly bonded multi-layer materials forming the piezoelectric components of piezo-electronic transistor devices. The assembly includes two perfectly conducting electrodes adjacent to piezoelectric layer(s). The assembly of layers is assumed to be epitaxial so that atoms of the crystal are associated with a lattice defining a local displacement vector and strain tensor. Because of epitaxy, layers have their own lattice spacing and account is taken additional strains and stresses arising due to lattice mismatch effects.

The multi-layered system can be subject to complex mechanical loading characterised by biaxial in-plane, uniform through-thickness loading, and orthogonal biaxial bending. Uniform temperature changes can be considered, and the application of a voltage across the electrodes. The model estimates the effective properties of the multi-layer, enabling predictions of stress and strain distributions when the system is subject to complex loading.

Model verification considers a free-standing multi-layer system subject to electrical loading. This challenging problem constrains boundary conditions to avoid edge effects, while accounting for clamping of the multi-layer. Results are presented comparing model predictions with results of finite element analysis (FEA). Excellent agreement verifies that the analytical model and associated software are working correctly, and will apply to diverse applications such as actuators and sensors in addition to piezo-electronic transistor devices.

Item Type: Article
Keywords: Piezoelectric, multilayered, lattice mismatch, validation, finite element analysis
Subjects: Advanced Materials > Functional Materials
Divisions: Electromagnetic & Electrochemical Technologies
Identification number/DOI: 10.1063/1.5054070
Last Modified: 24 Jun 2019 13:45
URI: http://eprintspublications.npl.co.uk/id/eprint/8429

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