Chintala, R C; Wood, S; Blakesley, J C; Favia, P; Celano, U; Paredis, K; Vandervorst, W; Castro, F A (2019) Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography. AIP Advances, 9 (2). 025105. 025105 ISSN 2158-3226

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Abstract

The 3D nanostructures of organic materials are critical to their performance in a broad range of fields, from life sciences to electronics. However, characterising the functionality of their morphologies presents a critical challenge requiring nanometre resolution in 3 dimensions and methods that do not excessively distort the soft matter during measurement. Here we present scanning probe tomography using a commercial Pt-Ir coated tip and precise control of the tip loading force to sequentially characterise and remove layers from the surface of a sample. We demonstrate this process on a sample exhibiting a polymer nanowire morphology, which is typically used for organic electronic applications, and present a tomographic reconstruction of the nanoscale charge transport network of the semi-crystalline polymer. Good electrical connectivity in 3D is demonstrated by directly probing the electrical properties of the inter-nanowire charge conduction.

Item Type:	Article
Subjects:	Advanced Materials > Functional Materials
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1063/1.5066458
Last Modified:	25 Apr 2019 14:44
URI:	http://eprintspublications.npl.co.uk/id/eprint/8377

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