Stant, L T; Salter, M J; Ridler, N M; Williams, D F; Aaen, P H (2019) Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models. IEEE Transactions on Microwave Theory and Techniques, 67 (2). pp. 815-821. ISSN 0018-9480

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Abstract

We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimetre-wave amplifier. We make use of the NIST Microwave Uncertainty Framework to evaluate the uncertainties in large-signal electromagnetic wave measurements of an amplifier, followed by the extraction of X-parameters using an industry standard algorithm. This extracted model is included as a component in a circuit simulator to evaluate gain and efficiency incorporating measurement uncertainty.

Item Type:	Article
Keywords:	Measurement uncertainty, microwave amplifiers, power amplifiers, microwave measurement, millimeter wave measurements, millimeter wave transistors, parameter extraction.
Subjects:	Electromagnetics
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/TMTT.2018.2881087
Last Modified:	16 Apr 2019 14:02
URI:	https://eprintspublications.npl.co.uk/id/eprint/8337