Wright, P.S.; Rietveld, G.; Leferink, F.; Van den Brom, H.E.; Alonso, F.R.I; Braun, J.P.; Ellingsberg, K.; Pous, M.; Svoboda, M. (2018) Evaluation of EMI Effects on Static Electricity Meters. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	Electromagnetics > Electrical Measurement
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/CPEM.2018.8500945
Last Modified:	10 Jan 2019 14:21
URI:	https://eprintspublications.npl.co.uk/id/eprint/8220