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Design and evaluation of nonlinear verification device for nonlinear vector network analyzers

Rajabi, M; Humphreys, D A; Avolio, G; Barmuta, P; Lukasik, K R; Nielsen, T S; Schreurs, D M M P (2018) Design and evaluation of nonlinear verification device for nonlinear vector network analyzers. IEEE Transactions on Microwave Theory and Techniques, 66 (2). pp. 1121-1130. ISSN 0018-9480

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Abstract

A simple diode-based Nonlinear Verification Device (NVD)designed for Noninear Vector Network Analyzers is presented together with an improved figure of merit (FOM) parameter that is insensitive to the impedance match and isolates variation of the device's nonlinear parameters. The stability over 84 hours and the load-pull performance of this newdesign have been evaluated

Item Type: Article
Keywords: Impedance matching, electromagnetic modeling, measurement uncertainty, microwave integrated circuits, nonlinear network analysis, semiconductor diodes.
Subjects: Electromagnetics > RF and Microwave
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1109/tmtt.2017.2762659
Last Modified: 20 Apr 2018 12:11
URI: http://eprintspublications.npl.co.uk/id/eprint/7867

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