Bongs, K*; Boyer, V*; Cruise, M A*; Freise, A*; Holynski, M*; Hughes, J*; Kaushik, A*; Lien, Y H*; Niggebaum, A*; Perea-Ortiz, M*; Petroz, P*; Plant, S*; Singh, Y*; Stabrawa, A*; Paul, D J*; Sorel, M*; Cumming, D R S*; Marsh, J H*; Bowtell, R W*; Bason, M G*; Beardsley, R P*; Campion, R P*; Brookes, M J*; Fernholz, T*; Fromhold, T M*; Hackermuller, L*; Kruger, P*; Li, X*; Maclean, J O*; Mellor, C J*; Novikov, S V*; Orucevic, F*; Rushforth, A W*; Welch, N*; Benson, T M*; Wildman, R D*; Greegarde, T*; Himsworth, M*; Ruostekoski, J*; Smith, P*; Tropper, A*; Griffin, P F*; Arnold, A S*; Riis, E*; Hastie, J E*; Paboeuf, D*; Parrotta, D C*; Garraway, B M*; Pasquazi, A*; Peccianti, M*; Hensinger, W*; Potter, E*; Nizamani, A H*; Bostock, H*; Blanco, A R*; Sinuco-Leon, G*; Hill, I R; Williams, R A; Gill, P; Hempler, N*; Malcolm, G P A*; Cross, T*; Kock, B O*; Maddox, S*; John, P* (2016) The UK national quantum technology hub in sensors and metrology. Proc. SPIE - Int. Soc. Opt. Eng., 9900. 990009
Full text not available from this repository.Abstract
No abstract available
Item Type: | Article |
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Subjects: | Time and Frequency Time and Frequency > Optical Frequency Standards and Metrology |
Identification number/DOI: | 10.1117/12.2232143 |
Last Modified: | 02 Feb 2018 13:13 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/7252 |
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