Kimmel, A V; Sushko, P V* (2015) Mechanisms of formation of chemica bonding and defect formation at the a-SiO2/BaTiO3 interfaces. J. Phys., Condens. Matter, 27 (47). 475006
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Item Type: | Article |
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Subjects: | Advanced Materials Advanced Materials > Electrochemistry |
Identification number/DOI: | 10.1088/0953-8984/27/47/475006 |
Last Modified: | 02 Feb 2018 13:13 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/6926 |
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