Mingard, K P; Day, A P*; Quested, P N (2014) Recent developments in two fundamental aspects of electron backscatter diffraction. IOP Conf. Series: Mater. Sci. Eng., 55. 012011

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Item Type:	Article
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Identification number/DOI:	10.1088/1757-899X/55/1/012011
Last Modified:	02 Feb 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/6141

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