Eio, C P (2012) A look at the sensitivity of the thru-reflect-line vector network analyzer calibration algorithm. In: 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012), 1-6 July 2012, Washington DC, USA.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Electromagnetics Electromagnetics > RF and Microwave
Identification number/DOI:	10.1109/CPEM.2012.6250640
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/5569