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Impedance of active devices using a real time digital oscilloscope and quarter-wave technique.

Miall, J (2012) Impedance of active devices using a real time digital oscilloscope and quarter-wave technique. In: 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012), 1-6 July 2012, Washington DC, USA.

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Abstract

A system has been constructed for measuring the reflection coefficient of active devices using a reflectometer with phase sensitive voltage measurements based on a real-time digital sampling oscilloscope with timebase correction provided by a reference pilot tone. A calibration scheme which does not require calculation of the reflectometer S-parameters or error terms is used by applying a small offset frequency from that of the active device.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keywords: reflectometer, cross ratio, reflection coefficient, timebase correction, active device
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Identification number/DOI: 10.1109/CPEM.2012.6251034
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5562

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