Tsoi, W C; Nicholson, P G; Kim J S*,, ; Roy, D; Burnett, T L; Murphy, C E; Nelson, J*; Bradley, D D C*; Kim, J-S*; Castro, F A (2011) Surface and subsurface morphology of operating nanowire: fullerene solar cells revealed by photoconductive-AFM. Energy Environ. Sci., 4 (9). pp. 3646-3651.

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Abstract

The 3D nanoscale phase separated morphology of organic solar cells crucially affects device performance. Here we demonstrate that photoconductive atomic force microscopy (PC-AFM) can provide not only surface but also subsurface morphological information in operating organic solar cells providing direct correlation of amongst film morphology, local nanoscale optoelectronic properties and device characteristics. We apply the technique to P3HT nanowire:PCBM bulk-heterojuntions and observe clear changes in nanowire distribution and shape within the film when the sample is annealed.

Item Type:	Article
Keywords:	photoconductive AFM, photovoltaic, organic solar cell, PC-AFM
Subjects:	Advanced Materials Advanced Materials > Photovoltaics
Identification number/DOI:	10.1039/c1ee01944a
Last Modified:	02 Feb 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/5258

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