< back to main site

Publications

Sensitivity analysis of flickermeter implementations to waveforms for testing to the requirements of IEC 61000-4-15.

Clarkson, P; Wright, P S (2010) Sensitivity analysis of flickermeter implementations to waveforms for testing to the requirements of IEC 61000-4-15. IET Sci. Meas. Technol., 4 (3). pp. 125-135.

Full text not available from this repository.

Abstract

Flickermeters are usually tested for compliance with IEC 61000-4-15 using an assumed response to basic waveforms documented in IEC 61000-4-15. This paper seeks to point out several drawbacks to this method of calibration, paying particular attention to the large uncertainties arising from several factors not specified in IEC 61000-4-15. Simulations carried out with a flickermeter model based on that given in IEC 61000-4-15 are used to show that a greater range of parameters of the calibration waveforms (e.g. modulator phase w.r.t. the carrier waveform) must be measured or accurately configured, if these waveforms are to be used as described in Table 5 of IEC 61000-4-15. Further, there are a number of factors in the design of the flickermeter itself that are not specified in IEC 61000-4-15 and these can also result in significantly different PST readings to those predicted by Table 5 of IEC 61000-4-15. The effect of these unspecified test and design parameters is discussed and their impact on uncertainties in flickermeter calibrations is assessed.

Item Type: Article
Subjects: Electromagnetics
Electromagnetics > Electrical Measurement
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4700

Actions (login required)

View Item View Item