Wickham, M; Hunt, C (2008) Test method for measurement of the propensity for conformal coatings to inhibit tin whiskering. NPL Report. MAT 28

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Abstract

A technique using interdigitated, specially electroplated discs has been developed at the National Physical Laboratory for determining the relative ability of conformal coatings to mitigate against Sn whisker growth. All the control samples without conformal coatings developed whiskers of sufficient length (>250mm) to cause electrical shorts between the discs. The electrical monitoring system was able to detect these shorts and the current flowing in the detection circuit was restricted to a level sufficient to prevent destruction of the whiskers. The control samples all exhibited electrical shorts within 14 days, some within as few as 3 days, allowing for a relatively rapid i.e. less than 12 week evaluation of the Sn whisker mitigation benefits of conformal coatings.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	MAT 28
Keywords:	electronics, lead-free, conformal coating, whisker
Subjects:	Advanced Materials Advanced Materials > Electronics Interconnection
Last Modified:	02 Feb 2018 13:15
URI:	http://eprintspublications.npl.co.uk/id/eprint/4356

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