Lowe, M J; Hegarty, T; Mingard, K P; Li, J*; Cain, M G (2008) Electron backscatter diffraction and piezoresponse force microscopy study of bulk and thin film pzt samples. Integrated Ferroelectrics, 98. pp. 136-143.

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Abstract

In this work, bulk and PZT thin films have been investigated with electron backscatter diffraction (EBSD) and piezoresponse force microscopy (PFM). After depositing a thin carbon layer to negate the effects of charging, EBSD was able to map the grain and domain orientations across the ferroelectric materials, showing features smaller than 100 nm. In addition, PFM was also performed in order to obtain quantifiable maps of the ferroelectric response. Both techniques indicated the presence of random grain and domain orientation in PZT(30/70) films deposited onto ITO/glass substrates. For these films, both single and multi domain grains were observed.

Item Type:	Article
Subjects:	Advanced Materials Advanced Materials > Functional Materials
Last Modified:	02 Feb 2018 13:15
URI:	http://eprintspublications.npl.co.uk/id/eprint/4227

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