Lord, J D; Gee, M G (1996) A review of methods for measuring small dimensional change due to thermal exposure in MMC and CMC. NPL Report. CMMT(A)14

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Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMMT(A)14
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:19
URI:	https://eprintspublications.npl.co.uk/id/eprint/404