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Oversampling delta-sigma ADC for metrology applications.

Georgakopoulos, D; Pickering, J R*; Williams, J M; Wright, P S (2004) Oversampling delta-sigma ADC for metrology applications. In: Conference on Precision Electromagnetic Measurements (CPEM) 2004, 27 June - 2 July 2004, London, UK.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3885

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