Niklewicz, J; Sims, G D (1999) The use of electronic speckle pattern interferometry for determining non-uniform strain fields. NPL Report. CMMT(MN)056

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Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMMT(MN)056
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/3200

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