Brewin, A; Zou, L; Hunt, C (2004) Susceptibility of glass-reinforced epoxy laminate to conductive anodic filamentation. NPL Report. MATC(A)155
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Abstract
Conductive Anodic Filamentation (CAF) is a subsurface failure mode for woven glass-reinforced laminate (FR4) materials, in which a copper salt filament grows and results in a consequential electrical short between plated through-hole (PTH) walls or adjacent copper planes. In this study FR4 laminates, in the form of high PTH density multi-layer test circuits, were exposed to different manufacturing conditions and studied for resistance to CAF initiation and growth. CAF performance was assessed using high temperature and humidity conditions to promote failures, with a voltage applied across adjacent vias. By application of a range of voltages and via geometries the basis for a performance map for laminates was obtained for use in materials comparison. The changes due to exposure of laminates to lead-free temperatures and other processing steps were then examined using the technique, and a number of important recommendations made regarding minimising the possibility of CAF initiation and growth.
Item Type: | Report/Guide (NPL Report) |
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NPL Report No.: | MATC(A)155 |
Subjects: | Advanced Materials Advanced Materials > Electronics Interconnection |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3017 |
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