Wickham, M; Fry, A T; Hunt, C (2003) Developing a test to characterise internal stress in tin coatings: phase 1. NPL Report. MATC(A)148

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Abstract

This report highlights the progress made in Phase 1 of a Studio Project aimed at formulating a practical test method for measuring the internal stresses in the coatings of electronic components based on the XRD technique. The work is driven by the necessity to be able to assess the potential of whisker growth (generated from internal stresses) from new lead-free finishes for these components. Such finishes are being explored in the light of the forthcoming ban on the use of lead. The work has identified the preferred test ageing conditions, the preferred locations for analysis, and the preferred methodology, thereby allowing a close definition of the work in Phase 2 of the project. Although the results have highlighted a good correlation between whisker growth and residual stress measurements, the later could not be used to predict the occurrence of whisker growth, only to characterise its extent.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	MATC(A)148
Subjects:	Advanced Materials Advanced Materials > Electronics Interconnection
Last Modified:	02 Feb 2018 13:16
URI:	http://eprintspublications.npl.co.uk/id/eprint/2922

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