Lea, S N; Rowley, W R C; Margolis, H S; Barwood, G P; Huang, G; Gill, P; Chartier, J.-M*; Windeler, R S* (2003) Absolute frequency measurements of 633 nm iodine-stabilised helium-neon lasers. Metrologia, 40. pp. 84-88.

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Abstract

The frequency of a helium-neon laser stabilised to the hyperfine component f (alternatively denoted as a16) of the 127I2 11-5 R(127) line at 633 nm has been measured with respect to the SI second using a femtosecond optical frequency comb generator based on a mode-locked Ti:sapphire laser and microstructure fibre. The standard uncertainty of this instrument is 0.6 kHz. The same laser was taken to BIPM mid-way through the measurements and its frequency compared to that of the BIPM's continuously-maintained iodine-stabilised helium-neon laser BIPM-4. From this comparison, the frequency of BIPM-4 when stabilised to the same iodine hyperfine component f is 473 612 353 608.1 (0.7) kHz.

Item Type:	Article
Keywords:	optical frequency standards
Subjects:	Time and Frequency Time and Frequency > Optical Frequency Standards and Metrology
Last Modified:	02 Feb 2018 13:16
URI:	http://eprintspublications.npl.co.uk/id/eprint/2654

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