Seah, M P; Gilmore, I S (2001) Simplified equations for correction parameters for elastic scattering effects for Q, ß and attenuation lengths in AES and XPS. Surf. Interface Anal., 31. pp. 835-846.

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Abstract

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Item Type:	Article
Keywords:	anisotropy, attenuation length, Auger electron spectroscopy, eleastic scattering corrections, quantification, X-ray photoelectron spectroscopy
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/2506