Abu Bakar, M*; Velichko, A V*; Lancaster, M J*; Porch, A*; Gallop, J C; Hao, L; Cohen, L F*; Zhukov, A* (2002) Microwave intermodulation distotion measurements in unpatterned and patterned YBCO thin film. Physica C, 372-37 (2). pp. 692-695.

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Abstract

We present the work on intermodulation distortion (IMD) in the unpatterned and patterned states of 1 cm2 YBCO films, employing dielectric resonator and coplanar resonator techniques, respectively. The unpatterned films are measured using rutile and sapphire dielectric resonators. Subsequently, these films are patterned into identical coplanar resonator structures. Third order IMD products vs. input power for all the films studied typically show a noticeable deviation from the conventional 3:1 scaling towards a lower slope. Third order intercept powers for unpatterned and patterned states of the films appear to be slightly different and also temperature dependent.

Item Type:	Article
Subjects:	Quantum Phenomena
Last Modified:	02 Feb 2018 13:17
URI:	http://eprintspublications.npl.co.uk/id/eprint/2477

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