Hunt, C (2001) Development of surface insulation resistance measurements for electronic assemblies. NPL Report. MATC(A)70

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Abstract

This report summarises the work of a team from National Physical Laboratory (NPL) of the UK, with the following three partners National Microelectronics Research Centre (NMRC) of Ireland, Siemens AG of Germany and Lares Cozzi (LC) of Italy. The authors from NPL are Christopher hunt and Liing Zou, from NMRC there was John Barton, from Siemens there were Klaus-Peter Galuschki and Hartmut Meier, and from LC there was Ed Seagraves. The project took as the starting point the international standard for SIR testing that existed at the time and developed this to reflect modern soldering processes and instrumentation capability. The work showed very clearly that current methods can frequently falsely predict pass/fail criteria for current fine pitch and fluxes. This work recommends a new SIR pattern and test strategy that reflects today's assembly processes, which is viewed by the authors as being essential if the reliability is going to be correctly identified. Siemens are using the results from this project to qualify all their fluxes.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	MATC(A)70
Subjects:	Advanced Materials Advanced Materials > Electronics Interconnection
Last Modified:	02 Feb 2018 13:17
URI:	http://eprintspublications.npl.co.uk/id/eprint/2411

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