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Mapping Measurement Impact Model.

Williams, F J; Bowns, S*; Bradley, I*; Williams, G* (1999) Mapping Measurement Impact Model. In: National Measurement Conference (NMC) 1999, 2-4 November 1999, Brighton, UK.

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This paper outlines the Mapping Measurement Impact Model used by the Department of Trade and Industry to economically assess the benefit to industry of different research projects to be funded as part of the National Measurement System and as a means to inter-compare their programmes.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions: Corporate Services
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/2293

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