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Error analysis in nanoindentation.

Shafirstein, G; Gee, M G; Osgerby, S; Saunders, S R J (1994) Error analysis in nanoindentation. In: Materials Research Society Symposium on Thim films: Stresses and mechanical properties V., November 1994, Boston, USA.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Advanced Materials
Advanced Materials > Surface Engineering
Last Modified: 02 Feb 2018 13:19
URI: http://eprintspublications.npl.co.uk/id/eprint/162

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