Shafirstein, G; Gee, M G; Osgerby, S; Saunders, S R J (1994) Error analysis in nanoindentation. In: Materials Research Society Symposium on Thim films: Stresses and mechanical properties V., November 1994, Boston, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Advanced Materials Advanced Materials > Surface Engineering |
Last Modified: | 02 Feb 2018 13:19 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/162 |
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